- Analytical High Resolution TEM- JEOL JEM 2100F
- Bench-top SEM -Phenom
- Critical Point Dryer (CPD)- Tousimis 931
- Cryo EM-GLACIOS
- Narrow (<10 eV) zero-loss energy filtering offers enhanced contrast for higher-resolution reconstructions
- Aberration correction, low image distortions, and uniform energy resolution over the entire field of view
- Cryo TEM-Talos F200C
- Cryo TEM-Tecnai T12 G2 TWIN
- Dual Beam FIB- Helios G4 UC
- EM VCT 500, Leica
- Freeze fracture ACE 900, Leica
- High pressure freezing EM ICE, Leica
- HRSEM- Verios 460L
- HRSEM (including cryo)- Gemini 300, Zeiss
The JEM-2100F, a Field Emission gun Transmission Electron Microscope, is a state of the art ultrahigh resolution analytical TEM that is capable of providing high spatial resolution atomic imaging and microstructure analysis of material samples.
By analytical characterization, we refer to determining the composition, crystallographic structure, chemical bonding, electronic structure, and mapping of electric and magnetic fields.
The imaging and spectroscopy methodologies we can employ in this lab are:
– Phase-contrast (high-resolution) transmission electron microscopy (TEM).
– Scanning TEM (STEM): High-angle annular dark-field (HAADF), Annular dark-field, Bright-field.
– Lorentz TEM for magnetic imaging (Fresnel-contrast, field free region, 0.1 Oe, for the sample).
– Off-axis electron holography for Lorentz TEM and for high-resolution TEM.
– Electron Energy Loss Spectroscopy (EELS) including energy-filtered TEM (EFTEM).
– Energy dispersive X-ray spectroscopy (EDS).
The Phenom XL G2 is a tabletop SEM system equipped with a CeB6 thermionic emitter. It can accommodate a sample size of up to 100x100x40 mm (LxWxH) and can operate at three vacuum levels, low, medium and high. The system has a scan area of 50×50 mm and includes a motorized stage. The system includes backscattered (BSD) and secondary electron detectors, as well as a fully integrated EDS system
Magnification range: 160 – 200,000x.
Acceleration voltages are adjustable range from 4.8kV to 20.5kV, with presets at 5kV, 10kV and 15kV.
Critical point drying is an efficient method for drying delicate samples for SEM applications. It preserves the surface structure of a specimen which could otherwise be damaged when drying.
The Thermo Fisher Scientific Glacios is a 200 kV transmission electron microscope with X-FEG and Falcon 4i detector coupled to a Selectris X energy filter for high-resolution structure determination of biological (and other soft matters) macromolecules. Its 12-grid autoloader allows efficient loading and unloading of cryo-EM grids. The automated EPU and Tomo software systems are used for automated data collection, capable of producing >300 movies/hour, for high-resolution single particle analysis and cryo-electron tomography.
Accelerating Voltage | 200 kV |
Electron Source | X-FEG |
Stage Tilt Range | ± 70° |
C2 Apertures | 150, 100, 70 and 50 µm |
Objective Apertures | 100, 70 and 30 µm |
Operating Temperature | ~80 K |
Information Limit at 0° / ±70° tilt | <0.2 nm / 0.34 nm |
Cs | 2.7 mm |
Number of cartridge positions for grids | 12 total |
Sample exchange time | ~3 mins from autoloader cassette to stage |
Camera | Falcon 4i |
Camera pixels | 14×14 micrometers pixel size, 4096×4096 pixels, Electron Event Recording |
The Selectris X is designed for stability and atomic resolution imaging
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The Thermo Fisher Scientific (former FEI) Talos F200C scanning / transmission electron microscope (S/TEM) is a powerful, versatile system for delivering 3D characterization of biological and biomaterials samples in cell biology, materials science, and nanotechnology research. The system’s constant-power (C-TWIN) lens delivers outstanding optical performance to help ensure an optimal balance between contrast and resolution. Designed for room and cryogenic temperature applications, Talos F200C enables experimentation spanning the complete application range—from TEM observation and STEM imaging to Low Dose applications and diffraction analysis.
The Tecnai T12 G2 TWIN TEM Thermo Fisher Scientific (former FEI) Transmission Electron Microscope (TEM) is an instrument with a design combining high contrast and resolution essential to visualizing image details in a wide range of samples at both room and cryogenic (cryo) temperatures. This microscope enables studies in a broad spectrum of science from hard to soft matter. On one hand, the high tilt capabilities of this microscope, equipped with single tilt holder, allow to perform high quality studies of crystalline materials. On the other hand, the set up in our laboratory, including a Low-Dose exposure technique, is configured to be optimal for cryo-TEM.
The Thermo Scientific Helios G4 UC redefines the standard in sample preparation and three-dimensional characterization through the most advanced focused ion- and electron beam performance. It designed to meet the needs of scientists and engineers, combining the SEM column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with superior Focused Ion Beam (FIB) ion column for the fastest, easiest, and most precise high-quality TEM sample preparation and 3D characterization, even on the most challenging samples.
The EM VCT 500 is a system for transferring the sample under vacuum and low temperature.
The ACE900 is a vacuum chamber equipped with a liquid nitrogen cooled knife for precise freeze-fracture for expose the inner surface of samples to be observed in the cryo-SEM. It is equipped with a temperature controlled stage that maintains the sample at low temperatures and allows a controlled etching.
The instrument is also equipped with electron-beam sources (carbon and platinum) for coating samples and has also an angular control over the evaporation direction and a rotating sample stage, which allows for both unidirectional or rotatory shadowing or double axis rotatory shadowing.
High pressure freezing achieves vitrification by rapid cooling under very high pressure.
The freezing procedure is based on pneumatic freezing principle without alcohol. The absence of alcohol in the chamber results in a faster pressure build up and faster freezing times which leads to better cryo-preservation.
The Thermo Fisher Verios 460L field-emission scanning electron microscope (FESEM) offers sub-nanometer resolution over a wide energy range 0.5-30 keV with excellent materials contrast. Its extraordinary low-voltage performance provides extremely precise, surface-specific information even on insulating samples with no conductive coating. The microscope is equipped with a wide array of imaging and analytical detectors for structural and compositional analysis. Verios 460L SEM at the IKI is equipped with an automatic sample loader, and with EDS, EBSD (Oxford Instruments) and STEM detectors.
– Resolution 0.7 nm @ 1 keV, 0.6 nm @ 2-30 keV
– Automatic LoadLock
– CCD IR inspection camera
– Beam deceleration
– Integrated Plasma cleaner
– Oil-free pumping system
– Electron detectors;
-ETD (Everhardt Thornley Detector)
-TLD (Through the Lens Detector)
-MD (Mirror Detector) mounted inside the objective lens; compositional and topographic contrast
-ICD (in-Column Detector) 10 cm above the MD in the column; reduced topographical but highlights compositional contrast
-BSD (Back Scatter Detector) retractable, inserted below the pole piece with 4 different concentric segments
-STEM (Scanning Transmission Electron Microscopy detector) retractable, BF DF HAADF (High Angle Angular Dark Field)
– Energy Dispersive Spectroscopy (EDS) Oxford Xmax 80 mm^2 127eV Silicon Drift Detector
– Electron Backscatter Diffraction (EBSD) detector
Gemini 300 field emission scanning electron microscope works both at high vacuum mode and several low vacuum levels. The variable pressure imaging option guarantees maximum versatility enabling in-lens detection in variable pressure (VP) mode. It allows imaging under wide range of accelerating voltages from 0.02 to 30 kV.
It is equipped with the following detectors: the Everhart-Thornley SE detector that collects SE2 electrons and provide topographical information; the high efficiency in-lens detector collects SE1 electrons and provide high resolution surface information; the EsB detector (Energy selective Backscattered) integrated in the Gemini objective lens that collects BS electrons at low voltages and provides low-loss BSE information; the BSD detector (Angular Selective Backscattered) that provides channeling, crystallographic and strain contrasts in addition to compositional or topography information; the VPSE detector (Variable Pressure Secondary Electrons) allowing imaging at low vacuum and the STEM detector collects transmitted electrons of thin samples at several modes (dark field (DF), oriented dark field (ODF), annular dark field (ADF) and high angle annular dark field (HAADF).
The SEM is also equipped with an EDS detector (Bruker XFlash 6, 60mm) and a cryo stage (Leica) for cryo-imaging of soft-materials including biological samples.