Two troughs are available
with 30cm2 min area and either 268 cm2 (Model 312D) or 718 cm2 (Model 712BAM)
max area. Troughs have dippers for transfer of monolayer onto solid substrates (up
to 3mm thickness).
- Langmuir Troughs
- Imaging Ellipsometer
- X-ray photoelectron spectroscopy- (XPS) ESCALAB Xi+ Thermo-Fisher Scientific
- The system is equipped with both a flood gun for charge compensation and an ion gun for controlled etching of surface layers while it is also capable of Ar+ cluster etch which allows for the removal of surface contaminants without damaging the surface.
- Two X-ray sources are available, one is the standard monochromatic Al-Kα source and the other one is an Ag-Lα which has greater ionization energy allowing inner core orbital excitations.
- UV photoelectron spectroscopy (UPS) allows valence band measurements of all sample types and evaluation of the work function for conducting samples.
- Ion Scattering Spectroscopy (ISS) is also available, allowing inspection of the topmost atomic layer composition of samples.
- Reflected electron energy loss spectroscopy (REELS) can allow measurement of electronic structure and the band gap surface plasmon phenomena and detection of hydrogen.
- A heating stage allows measurements to be performed in-situ in a temperature range from LN2 up to 700o
- Surface Potential Analyzer for Solid Samples ,SURPASS, Anton Paar
- BET- Autosorb iQ
- BET- NOVA touch
- Tensiometer- KSV Sigma 70
- Scanning Probe Microscopes (AFM) of Asylum Research (Oxford Instruments) | MFP-3D-Bio including ORCA-Nanoindenter Head | Cypher-ES
- Spectroscopic Ellipsometer Sentech SE800
Langmuir Troughs
Langmuir Troughs are capable of supporting and compressing monolayer films
at the air-water interface (surface-pressure / area isotherms).
Location: Building No. 51, Room No.114
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Imaging Ellipsometer
An Imaging Ellipsometer can capture a digital optical image of the sample surface (solid or liquid), similar to a Brewster Angle Microscope. Ellipsometric measurements can be carried out on regions of interest (ROI) within this image.
Location: Building No. 51, Room No.114
The EP3 measures at 530 nm wavelength, using a laser. It can be used on top of a Langmuir trough, or with a sample holder. It operates as a NULL ellipsometer.
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X-ray photoelectron spectroscopy- (XPS) ESCALAB Xi+ Thermo-Fisher Scientific
The ESCALAB Xi+ is a multi-technique instrument that provides elemental and chemical information about the surface region of nearly any solid material.
In this system, high-speed routine XPS analysis of both large and small areas is optimized in the range of 200-900µm, and lateral resolution can be extended to 50µm using a second iris.
The ESCALAB Xi+ provides the user with the most advanced parallel X-ray Photoelectron Imaging (XPI) capabilities for the analysis of small features at a spatial resolution of 50µm.
The X-ray source, pumping system, data acquisition system and sample movement are all fully computer-controlled, providing the user with an unattended operation for the analysis of large numbers of samples. An additional analytical capability is Angle-Resolved XPS (ARXPS) with the programmed sample tilt. In addition, a variety of sample holders allow for large samples, spinning of samples, and two specialized heating stages up to 700oC.
Location: Building No. 51, Room No. 017
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Surface Potential Analyzer for Solid Samples ,SURPASS, Anton Paar
measure surface potential of macroscopic solids
Location: Building No. 51, Room No.102
surface charge measurement based on streaming potential and streaming current. samples like films, fibers and particles (above 20 um) can be characterized, and their surface chemistry (pH titration) as well as liquid-on-solid surface adsorption processes can be understand
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BET- Autosorb iQ
A highly sophisticated gas sorption analyzer available with up to three physisorption analysis ports for surface area analysis and pore size measurements; any or all can be equipped for low pressure micropore analysis including 0.1 torr transducer(s).
Location: Building No. 51, Room No.132
Specification:
Surface area of 0.01 m2/g and upwards can be determinated using nitrogen
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BET- NOVA touch
The NOVAtouch™- Series gas sorption analyzers deliver increased throughput and superior performance for BET surface area and pore size analyses. Eight models are available as standard and advanced LX versions with 1-to-4 analysis stations, a dedicated Po station, and four built-in sample preparation ports. All NOVAtouch™ models can produce BET surface area results using the classical helium void volume method, or via the patented helium-free method. Every NOVAtouch™ is also a pore size analyzer capable of measuring both adsorption and desorption isotherms with BET surface area results provided in a matter of minutes.
Location: Building No. 51, Room No.132
Specification:
• Analyze up to 2000 data points (1000 adsorption points and 1000 desorption points).
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Tensiometer- KSV Sigma 70
The tensiometer is using for measurements surface tension and interfacial tension of liquids, and also for dynamic contact angle and critical micelle
concentration measurements.
Measuring Principle: Electrobalance with torsion wire Taring: Manual coarse taring. Computer controlled fine taring
Optional use of counterweight
Measurements are made in air under ambient conditions
Location: Building No. 51, Room No.223
Measuring Ranges:
Range Maximum Load Resolution
25 mN 5.0 g 1 µN (0.1 mg)
2.5 mN 2.5 g 0.1 µN (10 µg)
0.25 mN 1.25 g 0.01 µN (1µg)
For standard KSV probes (made according to the
requirements of DIN and ASTM standards) the theoretical limits are as follows:
Ring: Maximum Load: 880 mN/m
Maximum Resolution: 0.0003 mN/m
Plate: Maximum Load: 2640 mN/m
Maximum Resolution: .001 mN/m
In actual practice reproducibility of surface and probe limit reproducibility of data to about 0.01 mN/m.
Lifting System
Stage Speed 0.1 to 40 mm/min (1.7 to 667 µ/sec)
Speed Adjustment increments of 0.1 mm/min (1.7 µ/sec)
Maximum Stroke 75 mm Motor servo controlled DC motor
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Scanning Probe Microscopes (AFM) of Asylum Research (Oxford Instruments) | MFP-3D-Bio including ORCA-Nanoindenter Head | Cypher-ES
The MFP-3D-Bio and the Cypher-ES are dedicated to research (as opposed to metrology or fabrication). They have a particular wide range of well-designed, useful accessories. The software can be modified by the user, in order to accomplish particular tasks. Unlike the majority of SPMs, which are built essentially as a “black box””, the instruments of Asylum Research are of utmost flexibility.
The MFP-3D-Bio comes with many accessories which are useful for biological applications. It is combined with an Inverted Optical Microscope. It has a wide range of mechanical and electrical characterization modes, temperature and humidity control, and more.
The Cypher-ES (Environmental Scanner) allows for temperature control, working in inert atmosphere, working with highly volatile liquids, and work under flow. The Cypher-ES has a particular low noise level. It can work with ultra-small cantilevers.
The mechanical testing modes of the MFP are complemented with a Nanoindenter. The Nanoindenter can use conductive probes.
All instruments are equipped with LVDT position sensors. This enables precise positioning, accurate readings, and makes piezo re-calibration unnecessary. Sample size is limited, in particular for the Cypher-ES. All instruments use “bottom scanner”, so the samples must typically be glued to a holder.
Location: Building No. 51, Room No. 004
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Spectroscopic Ellipsometer Sentech SE800
The Sentech SE800 Spectroscopic Ellipsometer is using a Xe-white light source and a diffraction grating with an array of photodiodes to capture data for many wavelengths simultaneously. It can measure at multiple angles of incidence, mapping sample stage and optional microspot optics.
Measurements are made in air under ambient conditions.
Location: Building No. 51, Room No. 004
Wavelength range: 280 nm to 850 nm
Wavelength resolution: ~ 1 nm
Angle of incidence: ~ 55 deg to ~ 70 deg
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