Scattering and X-Ray Analysis

Rigaku Synergy-S is a high-performance single-crystal X-ray diffractometer designed for precise structural determination.
It features a HyPix-Arc 100° curved hybrid photon detector and a kappa multi-axis goniometer for flexible crystal orientation.
The system operates with dual radiation sources (Cu, Mo), allowing versatile sample analysis.
A cryo-system enables low-temperature measurements for temperature-sensitive structures.
It can analyze very small crystals (10 µm and above) and is also capable of high-resolution powder diffraction for sub-milligram samples.

Wavelengths dispersive X-Ray Fluorescence Spectrometer (WDXRF) Axios, PANalytical Co. for  non-destructive elemental analysis of solid, liquid and powder samples.

X-ray computerized microtomography (microCT) uses broad spectrum X-ray radiation to create cross-section images of an object, which can then be used to recreate a ‘3-dimensional’ virtual model. The technique is non-destructive with results corresponding to 2-dimensional maps of X-ray penetration through the sample (roughly correlates to differences in material density). The technique is used primarily for imaging, but can also provide quantitative maps of: high-density inclusions, pore spaces, and density changes across samples, for example.

The ESCALAB Xi+ is a multi-technique instrument that provides elemental and chemical information about the surface region of nearly any solid material.
In this system, high-speed routine XPS analysis of both large and small areas is optimized in the range of 200-900µm, and lateral resolution can be extended to 50µm using a second iris.

The ESCALAB Xi+ provides the user with the most advanced parallel X-ray Photoelectron Imaging (XPI) capabilities for the analysis of small features at a spatial resolution of 50µm.
The X-ray source, pumping system, data acquisition system and sample movement are all fully computer-controlled, providing the user with an unattended operation for the analysis of large numbers of samples. An additional analytical capability is Angle-Resolved XPS (ARXPS) with the programmed sample tilt. In addition, a variety of sample holders allow for large samples, spinning of samples, and two specialized heating stages up to 700^oC.

X-ray diffractometry (XRD) measures the scatter of a focused beam of X-rays as it passes through a crystalline material. The phenomenon arises from the scattering of X-rays by the electrons of the atoms in the material, without a change in the wavelength of the X-rays. X-ray diffractometry, the measure of this change in direction in X-ray counts versus diffraction angle (2 pheta) is a key material characterization technique. Diffractometry provides material structural information independent of elemental composition. XRD is nondestructive and can be used to identify and determine the crystal structures of metals, alloys, minerals, inorganic compounds, organic compounds, polymers, cements and other materials. In additional to the identification of unknown compounds and the determination of crystal structures; XRD results can be used to derive information on the crystallite size, lattice strain, surface (and interface) roughness, crystallographic orientation, and crystal defects within materials.

SAXLAB’s GANESHA 300 XL- provides information on the structure and dynamics of molecular assemblies like: polymers, colloids and porous materials at Q range of 0.003 to 2A-1

Meausre Diffusion coefficient by nanoparticle tracking for nanometric solutions.

zeta potential and dynamic light scattering

CGS-3 LSE-5004 cross-correlator and CGS-3 LSE-5003 correlator measure dynamic and static light scattering by multiangle system for nanometric solutions.