- Plunger- Leica EM GP 2
- S/TEM Spectra 200
- Source:
- X-CFEG: Ultra-high-brightness cold field emission gun with energy resolution of < 0.4 eV.
- Flexible high-tension range from 30 – 200 kV.
- Optical column and corrector:
- Three lens condenser illumination system
- S-CORR probe corrector provides sub-Angstrom imaging resolution at 60 kV as specification and an order of magnitude improvement in optical stability. The S-CORR corrects A5 for all accelerating voltages.
- Symmetric S-TWIN objective lens with widegap pole piece design of 5.4 mm allows double tilt of ± 30° in alfa and beta.
- Resolution:
- Information limit: 110 pm
- STEM resolution: 60 pm @ 200 kV and 136 pm @ 60 kV
- EDS – Super-X detector:
- High-sensitivity, windowless EDS, 4 symmetrical segment detector system based on SDD technology.
- Energy resolution: ≤ 136 eV for Mn-Kα.
- TEM imaging with Ceta-M 16M CMOS camera (with speed enhancement) designed for imaging and diffraction applications.
- STEM imaging with Bright field (BF), Dark field (DF) and/or High Angle Annular Dark Field (HAADF) detectors.
- TEM tomography.
- STEM and EDS tomography.
- iDPC mode (for light elements).
- Precession diffraction with NanoMegas hardware and software package.
- 200 kV
- 60 kV
- Single tilt holder
- Double tilt low background analytical holder (optimized for EDS analysis)
- Double tilt hex-lock analytical holder (for magnetic samples)
- Tomography analytical holder (± 70°)
- NanoEx™–i/v – single tilt TEM holder for heating and biasing
- Sputter coater: Emitech K575X
- Sputter coater: Quorum Q150T ES
Leica EM GP 2 is used for the preparation of vitrified fluid samples or extremely thin samples for cryo-TEM, including biological suspensions and industrial emulsions in both, aqueous and inorganic solvents.
Spectra 200 (S)TEM for Materials Science is a high-throughput platform for atomic-scale materials science investigations. Optimized STEM electron optical performance with probe aberration corrector and ultra-sensitive detection enables the best combination of imaging and analysis. Optimum elemental analysis with EDS provided by the combination of an ultra-high-brightness Cold-FEG (X-CFEG) and Super-X detector configuration to suit the widest range of specimens and experiments. Combination of constant power optics, ultra-high brightness X-CFEG, sensitive detection and the wide-gap pole piece enable to detect light elements (from Boron and above) and most sensitive materials that can be characterized at the atomic scale.
System:
Available techniques:
Available acceleration voltages:
Available holders:
Flash carbon deposition for coating specimens with carbon
Sputter coater for coating specimens with non-oxidising (noble) metals, such as gold, Chromium, platinum, gold- palladium, Nickel and iridium.