The JEM-2100F, a Field Emission gun Transmission Electron Microscope, is a state of the art ultrahigh resolution analytical TEM that is capable of providing high spatial resolution atomic imaging and microstructure analysis of material samples.
By analytical characterization, we refer to determining the composition, crystallographic structure, chemical bonding, electronic structure, and mapping of electric and magnetic fields.
The imaging and spectroscopy methodologies we can employ in this lab are:
– Phase-contrast (high-resolution) transmission electron microscopy (TEM).
– Scanning TEM (STEM): High-angle annular dark-field (HAADF), Annular dark-field, Bright-field.
– Lorentz TEM for magnetic imaging (Fresnel-contrast, field free region, 0.1 Oe, for the sample).
– Off-axis electron holography for Lorentz TEM and for high-resolution TEM.
– Electron Energy Loss Spectroscopy (EELS) including energy-filtered TEM (EFTEM).
– Energy dispersive X-ray spectroscopy (EDS).