X-ray diffractometry (XRD) measures the scatter of a focused beam of X-rays as it passes through a crystalline material. The phenomenon arises from the scattering of X-rays by the electrons of the atoms in the material, without a change in the wavelength of the X-rays. X-ray diffractometry, the measure of this change in direction in X-ray counts versus diffraction angle (2 pheta) is a key material characterization technique. Diffractometry provides material structural information independent of elemental composition. XRD is nondestructive and can be used to identify and determine the crystal structures of metals, alloys, minerals, inorganic compounds, organic compounds, polymers, cements and other materials. In additional to the identification of unknown compounds and the determination of crystal structures; XRD results can be used to derive information on the crystallite size, lattice strain, surface (and interface) roughness, crystallographic orientation, and crystal defects within materials.
The XRD lab at IKI has two Panalytical Empyrean Multi-purpose Diffractometers. Both diffractometers are Cu-source XRD systems (Cu Ka = 1.540Å) equipped with Ni-filters to eliminate Kb radiation. Both systems can measure powder samples and both have auto-sampler attachments capable of holding up to 45 samples (each). Additional laboratory functionalities are distributed between the two systems as follows:
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