Dual Beam FIB- Helios G4 UC
The Thermo Scientific Helios G4 UC redefines the standard in sample preparation and three-dimensional characterization through the most advanced focused ion- and electron beam performance. It designed to meet the needs of scientists and engineers, combining the SEM column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with superior Focused Ion Beam (FIB) ion column for the fastest, easiest, and most precise high-quality TEM sample preparation and 3D characterization, even on the most challenging samples.
Location: Building No. 51, Room No. 016
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